Design - Analysis
The resulting physical design of the MCM must do much more than simply fit
into the customer's allocated space. The MCM has both electrical and
mechanical performance requirements which must be met. Confirmation that
the MCM design meets those requirements can be done through analysis and
through test. This page describes the analysis options.
Mechanical
Electrical
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Mechanical
The mechanical requirements placed on MCMs vary significantly - from
commercial to military environments. Often, previous analysis on MCM
designs or processes give enough insight to allow the MCM designer know
that the MCM can satisfy customer requirements.
But because MCMs are typically custom designs, the following analyses must
be usually be performed to confirm that the MCM design will meet requirements.
Thermal Analysis (temperature)
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Thermal Analysis (stress)
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Substrate Warp
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Shock
| Covers device attach and wirebonds.
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Vibration
| Covers device attach and wirebonds.
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PTH/Via deformation/fatigue
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Solder joint deformation/fatique
| Is often considered the responsibility of the next level of assembly
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Lead Strength
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Die Shear Strength
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Lid Deflection
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Electrical
Because of the relatively high cost of MCMs, customer typically attempt
to complete their products using discretely package devices. In support
of that, they typically create a breadboard of their design to confirm
electrical operation of the schematic. Analysis performed by MCM engineers
typically begins with the assumption that the basic design works and is
targeted on determining how the packaging approach affects the design
performance.
Timing
Timing analysis is geared towards determining the delays experienced by
signals between two points. Signals move along traces at predictable
speeds, primarily as a function of the dielectric constant. In practical
terms, this means that a timing analysis equates to calculating the length
of all traces. This information is translated to time delay and compared
to the requirements as provided by the customer.
A point to remember is that the shortest possible trace (no delay) is not
always required. Since correct signal timing involves both rise times as
well as hold times, designs may operate under both minimum and maximum
signal delay times - and which may be different for each trace.
In special cases, the timing requirements may involve matching time delays
between signals or within groups of signals. This correlates to specifying
line lengths between specific signals - often to within less than 100 mils.
This can place significant demands on a router, resulting in significant
increases in layer count.
Signal Integrity
A general goal in signal transmission is that the signal at the receiving
end replicate the signal that was transmitted - signal integrity. In most
designs, there is always some distortion, arising from several sources.
- Energy loss
- Reflections
- Crosstalk
- Power supply noise
EMI
Almost any metallic surface acts as both a receiver and transmitter of
electromagnetic radiation. The goal in MCM design is to minimize those
effects. Fortunately, in most designs the effects are small and special
design techniques are not required. However, as frequencies move above
100MHz the effects become more pronounced. At 500MHz and higher, it is
almost always necessary introduce design controls to manage the EMI
effects.
A special case under EMI is the effect that floating metal planes (such
as the MCM lid) can have. Such planes can act as excellent antennas and
specific actions are needed to isolate the received signals from the
MCM.
Resistor Design
In many cases, the use of integrated (or embedded) resistors is used as part
of an MCM design. This approach minimizes the size taken up by the devices
and allows customization of the design values. Designing the physical
dimensions of the resistors, in order to achieve the correct resitance
value, is one of the analyses performed by the MCM engineer.
Design-for-Test
At the time that MCMs are manufactured, they typical go through an electrical
test to confirm their operation. Additional tests may be needed to
troubleshoot failed MCMs in order to determine what repair actions are
needed.
Such tests require not only access to
key I/O within the MCM design, but may also require the introduction of
additional circuitry to interface with the test equipment and test software.
It is also typical that some test points (for troubleshooting purposes) may
be brought to the surface of the MCM interconnect, but not brought out to
the MCM I/O (leads or BGA pads). Introduction of these test points can
have negative effects on the MCM performance, so their impacts must be
evaluated carefully.
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